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Title: Investigation of buffer layer process on CIGS solar cells by dual beam optical modulation technique

Conference ·
OSTI ID:302517
; ; ; ;  [1]
  1. Univ. of Florida, Gainesville, FL (United States)

A contactless, nondestructive reflection mode Dual Beam Optical Modulation (DBOM) technique has been employed to investigate the effects of different CdS buffer layer processings (i.e., CBD, MOCVD, and sputtering) on the properties of CIS/CIGS films. The results show a significant increase in the DBOM signal ({Delta}I/I) which is attributed to change of the free carrier absorption and of excess carrier lifetime in the absorber layer, after the buffer layer processing. In order to explain the observed DBOM results, an analytical model for the CIGS P-N junction cell is derived which contains the functional dependence of {Delta}I/I on the surface/interface recombination velocities, excess carrier lifetimes, diffusion length and depletion layer width in the CIS or CIGS cells. A detailed comparison of the DBOM data versus different processing is presented in this paper.

Sponsoring Organization:
USDOE, Washington, DC (United States)
OSTI ID:
302517
Report Number(s):
CONF-970953-; TRN: IM9904%%305
Resource Relation:
Conference: 26. IEEE photovoltaic specialists conference, Anaheim, CA (United States), 29 Sep - 3 Oct 1997; Other Information: PBD: 1997; Related Information: Is Part Of Conference record of the twenty sixth IEEE photovoltaic specialists conference -- 1997; PB: 1477 p.
Country of Publication:
United States
Language:
English