skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: New electron cyclotron emission diagnostic for measurement of temperature based upon the electron Bernstein wave

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1149464· OSTI ID:295673
; ; ; ;  [1]
  1. Princeton University Plasma Physics Lab, Princeton, New Jersey 08543 (United States)

Most magnetically confined plasma devices cannot take advantage of standard electron cyclotron emission (ECE) diagnostics to measure temperature. They either operate at high density relative to their magnetic field (e.g., {omega}{sub p}{gt}{Omega}{sub c} in spherical tokamaks) or they do not have sufficient density and temperature to reach the blackbody condition ({tau}{gt}2). The standard ECE technique measures the electromagnetic waves emanating from the plasma. Here we propose to measure electron Bernstein waves (EBW) to ascertain the local electron temperature in these plasmas. The optical thickness of EBW is extremely high because it is an electrostatic wave with a large k{sub i}. For example, the National Spherical Torus Experiment (NSTX) will have an optical thickness {tau}{approx}3000 and CDX-U will have {tau}{approx}300. One can reach the blackbody condition with a plasma density {approx}10{sup 11}thinspcm{sup {minus}3} and T{sub e}{approx}1thinspeV. This makes it attractive to most plasma devices. The serious issue with using EBW is the wave accessibility for the emission measurement. Simple accessibility arguments indicate the wave may be accessible by either direct coupling or mode conversion through an extremely narrow layer ({approx}1{endash}2 mm). EBW experiments on the Current Drive Experiment-Upgrade (CDX-U) will test the accessibility properties of the spherical tokamak configuration. {copyright} {ital 1999 American Institute of Physics.}

OSTI ID:
295673
Report Number(s):
CONF-980605-; ISSN 0034-6748; TRN: 99:001859
Journal Information:
Review of Scientific Instruments, Vol. 70, Issue 1; Conference: 12. topical conference on high-temperature plasma diagnostics, Princeton, NJ (United States), 7-11 Jun 1998; Other Information: PBD: Jan 1999
Country of Publication:
United States
Language:
English

Similar Records

Electron Bernstein wave electron temperature profile diagnostic (invited)
Journal Article · Mon Jan 01 00:00:00 EST 2001 · Review of Scientific Instruments · OSTI ID:295673

13th TOPICAL CONFERENCE ON HIGH TEMPERATURE PLASMA DIAGNOSTICS SCIENTIFIC PROGRAM
Conference · Sat Jul 01 00:00:00 EDT 2000 · OSTI ID:295673

Electron Bernstein wave electron temperature profile diagnostic
Technical Report · Thu Jul 20 00:00:00 EDT 2000 · OSTI ID:295673