Filtered x-ray diode diagnostics fielded on the {ital Z} accelerator for source power measurements

Journal Article · Fri Jan 01 00:00:00 EST 1999 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1149355· OSTI ID:295630

Chandler, G A; Deeney, C; Cuneo, M; Fehl, D L; McGurn, J S; Spielman, R B; Torres, J A ^[1]; McKenney, J L; Mills, J ^[2]; Struve, K W ^[3]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
2. KTECH Corporation, 901 Pennsylvania Avenue Northeast, Albuquerque, New Mexico (United States)
3. Mission Research Corporation, Albuquerque, New Mexico 87106 (United States)

Filtered x-ray diode (XRD) detectors are used as primary radiation flux diagnostics on Sandia{close_quote}s Z accelerator, which generates nominally a 200-TW, 2-MJ, x-ray pulse. Given such flux levels and XRD sensitivities the detectors are being fielded 23 m from the source. The standard diagnostic setup and sensitivities are discussed. Vitreous carbon photocathodes are being used to reduce the effect of hydrocarbon contamination present in the Z-machine vacuum system. Nevertheless pre- and postcalibration data taken indicate spectrally dependent changes in the sensitivity of these detectors by up to factors of 2 or 3. {copyright} {ital 1999 American Institute of Physics.}

• OSTI ID: 295630
• Report Number(s): CONF-980605-; ISSN 0034-6748; TRN: 99:001816
• Journal Information: Review of Scientific Instruments, Vol. 70, Issue 1; Conference: 12. topical conference on high-temperature plasma diagnostics, Princeton, NJ (United States), 7-11 Jun 1998; Other Information: PBD: Jan 1999
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION
PHOTODIODES
PLASMA DIAGNOSTICS
ACCELERATORS
IMPLOSIONS
LINEAR Z PINCH DEVICES
X-RAY DETECTION
PHOTOCATHODES
POWER
PHOTOEMISSION