skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Development of “GaSb-on-silicon” metamorphic substrates for optoelectronic device growth

Journal Article · · Journal of Vacuum Science and Technology B
DOI:https://doi.org/10.1116/6.0003211· OSTI ID:2320342
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [2];  [3]; ORCiD logo [3];  [3];  [3]; ORCiD logo [3]; ORCiD logo [3]; ORCiD logo [1]
  1. University of New Mexico, Albuquerque, NM (United States)
  2. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States). Center for Integrated Nanotechnologies
  3. Naval Research Laboratory (NRL), Washington, DC (United States)

The epitaxial development and characterization of metamorphic “GaSb-on-silicon” buffers as substrates for antimonide devices is presented. The approach involves the growth of a spontaneously and fully relaxed GaSb metamorphic buffer in a primary epitaxial reactor, and use of the resulting “GaSb-on-silicon” wafer to grow subsequent layers in a secondary epitaxial reactor. The buffer growth involves four steps—silicon substrate preparation for oxide removal, nucleation of AlSb on silicon, growth of the GaSb buffer, and finally capping of the buffer to prevent oxidation. This approach on miscut silicon substrates leads to a buffer with negligible antiphase domain density. The growth of this buffer is based on inducing interfacial misfit dislocations between an AlSb nucleation layer and the underlying silicon substrate, which results in a fully relaxed GaSb buffer. A 1 μm thick GaSb layer buffer grown on silicon has ~9.2 × 107 dislocations/cm2. The complete lack of strain in the epitaxial structure allows subsequent growths to be accurately lattice matched, thus making the approach ideal for use as a substrate. Here we characterize the GaSb-on-silicon wafer using high-resolution x-ray diffraction and transmission electron microscopy. The concept’s feasibility is demonstrated by growing interband cascade light emitting devices on the GaSb-on-silicon wafer. The performance of the resulting LEDs on silicon approaches that of counterparts grown lattice matched on GaSb.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Science (SC); USDOE National Nuclear Security Administration (NNSA); Army Research Office (ARO); Air Force Research Laboratory; National Science Foundation (NSF)
Grant/Contract Number:
NA0003525; W911NF1910370; F19451-22-2-0016; DMR-1828731
OSTI ID:
2320342
Report Number(s):
SAND-2024-02573J
Journal Information:
Journal of Vacuum Science and Technology B, Vol. 42, Issue 1; ISSN 2166-2746
Publisher:
American Vacuum Society / AIPCopyright Statement
Country of Publication:
United States
Language:
English

Similar Records

Growth and characterization of GaAsSb metamorphic samples on an InP substrate
Journal Article · Mon May 15 00:00:00 EDT 2006 · Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films · OSTI ID:2320342

Relaxation dynamics and residual strain in metamorphic AlSb on GaAs
Journal Article · Mon Jan 02 00:00:00 EST 2012 · Applied Physics Letters · OSTI ID:2320342

The growth of GaSb/Al{sub 0.33}Ga{sub 0.67}Sb MQW on n-Silicon (1 0 0) with Al{sub 0.66}Ga{sub 0.34}Sb/AlSb SPS layers
Journal Article · Mon Sep 15 00:00:00 EDT 2014 · Materials Research Bulletin · OSTI ID:2320342