Localization of the Wannier–Mott Exciton on a Langmuir-Film/CdS Organic Semiconductor Interface

Journal Article · Mon Jul 15 00:00:00 EDT 2019 · Physics of the Solid State

DOI:https://doi.org/10.1134/S1063783419070175· OSTI ID:22925201

Novak, V. R. ^[1]; Sel’kin, A. V. ^[2]

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1. NT-MDT Spectrum Instruments Ltd. (Russian Federation)
2. Ioffe Institute (Russian Federation)

The low-temperature (T = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state A{sub n} {sub = 1} in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.

• OSTI ID: 22925201
• Journal Information: Physics of the Solid State, Vol. 61, Issue 7; Other Information: Copyright (c) 2019 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7834
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CADMIUM SULFIDES
CRYSTALS
DEPOSITION
EXCITONS
ORGANIC SEMICONDUCTORS
SPECTRA
SURFACES
TEMPERATURE RANGE 0065-0273 K
THIN FILMS
VISIBLE RADIATION