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Title: Construction of N-doped TiO2/MoS2 heterojunction with synergistic effect for enhanced visible photodegradation activity

Journal Article · · Materials Research Bulletin
; ; ; ;  [1]
  1. Department of Materials and Chemical Engineering, Hunan Institute of Technology, Hengyang 421002 (China)

Highlights: • An N-doped TiO{sub 2}/MoS{sub 2} heterojunction is successfully synthesized by a hydrothermal method. • N-doped TiO{sub 2}/MoS{sub 2} heterojunction photocatalyst exhibits enhanced visible photodegradation activity. • The synergistic effect is between N-doping and coupling with MoS{sub 2}. • Superoxide radicals (O{sub 2}{sup −}) and photogenerated holes (h{sup +}) are chiefly responsible for the degradation process. - Abstract: An N-doped TiO{sub 2}/MoS{sub 2} heterojunction photocatalyst constructed by two-dimension MoS{sub 2} nanosheets and N-doped TiO{sub 2} nanoparticles was successfully synthesized by a hydrothermal method. The synthesized N-TiO{sub 2}/MoS{sub 2} composites were characterized by XRD, XPS, TEM, UV–vis DRS and PL, and its visible photocatalytic activity was evaluated by degradation of methylene blue. The results showed that N-doped TiO{sub 2}/MoS{sub 2} heterojunction photocatalyst achieved more enhanced photocatalytic activity compared with pure TiO{sub 2}, MoS{sub 2} and N-doped TiO{sub 2} for degradation of MB. Trapping tests with different scavengers indicated that not hydroxyl radicals (OH) but superoxide radicals (O{sub 2}{sup −}) and photogenerated holes (h{sup +}) were highly responsible for the degradation process. The reusable experiments showed that the prepared N-doped TiO{sub 2}/MoS{sub 2} heterojunction photocatalyst was stable during the photodegradation of MB and will have practical applications for environmental remediation.

OSTI ID:
22805179
Journal Information:
Materials Research Bulletin, Vol. 105; Other Information: Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English