Room temperature photoluminescence properties of ZnO nanorods grown by hydrothermal reaction
- Prodi Ilmu Material, Departemen Fisika, FMIPA, Universitas Indonesia, Kampus UI Depok (Indonesia)
- Institute of Microengineering and Nanoelectronics, Universiti Kebangsaan Malaysia, UKM Bangi, Selangor (Malaysia)
- School of Electrical & Electronic Engineering, Nanyang Technological University, Nanyang Avenue (Singapore)
Zinc oxide (ZnO) nanorods were fabricated by a hydrothermal reaction on silicon (Si) substrate at 95 °C for 6 hours. The ZnO seed layer was fabricated by depositing ZnO thin films on Si substrates by ultrasonic spray pyrolisis (USP). The annealing effects on crystal structure and optical properties of ZnO nanorods were investigated. The post-annealing treatment was performed at 800 °C with different environments. The annealed of ZnO nanorods were characterized by X-ray diffraction (XRD) and photoluminescence (PL) in order to analyze crystal structure and optical properties, respectively. The results show the orientations of [002], [101], [102], and [103] diffraction peaks were observed and hexagonal wurtzite structure of ZnO nanorods were vertically grown on Si substrates. The room temperature PL spectra show ultra-violet (UV) and visible emissions. The annealed of ZnO nanorods in vacuum condition (3.8 × 10{sup −3} Torr) has dominant UV emission. Meanwhile, non-annealed of ZnO nanorods has dominant visible emission. It was expected that the annealed of ZnO in vacuum condition suppresses the existence of native defects in ZnO nanorods.
- OSTI ID:
- 22606708
- Journal Information:
- AIP Conference Proceedings, Vol. 1729, Issue 1; Conference: ISCPMS 2015: 1. international symposium on current progress in mathematics and sciences, Depok (Indonesia), 3-4 Nov 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNEALING
CRYSTAL STRUCTURE
CRYSTALS
DEFECTS
HYDROTHERMAL SYNTHESIS
NANOSTRUCTURES
OPTICAL PROPERTIES
PHOTOLUMINESCENCE
SILICON
SPECTRA
SPRAYS
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X RADIATION
X-RAY DIFFRACTION
ZINC OXIDES