Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry
- Department of Physics & Astronomy and The Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, Ohio 43606 (United States)
Ex-situ spectroscopic ellipsometry measurements are made on radio frequency magnetron sputtered oxygenated cadmium sulfide (CdS:O) thin films. Films are deposited onto glass substrates at room temperature and at 270 °C with varying oxygen to total gas flow ratios in the sputtering ambient. Ellipsometric spectra from 0.74 to 5.89 eV are collected before and after annealing at 607 °C to simulate the thermal processes during close-space sublimation of overlying cadmium telluride in that solar cell configuration. Complex dielectric function (ε = ε{sub 1} + iε{sub 2}) spectra are extracted for films as a function of oxygen gas flow ratio, deposition temperature, and post-deposition annealing using a parametric model accounting for critical point transitions and an Urbach tail for sub-band gap absorption. The results suggest an inverse relationship between degree of crystallinity and oxygen gas flow ratio, whereas annealing is shown to increase crystallinity in all samples. Direct band gap energies are determined from the parametric modeling of ε and linear extrapolations of the square of the absorption coefficient. As-deposited samples feature a range of band gap energies whereas annealing is shown to result in gap energies ranging only from 2.40 to 2.45 eV, which is close to typical band gaps for pure cadmium sulfide.
- OSTI ID:
- 22597893
- Journal Information:
- Journal of Applied Physics, Vol. 120, Issue 1; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSORPTION
ANNEALING
CADMIUM SULFIDES
CADMIUM TELLURIDES
DEPOSITION
DEPOSITS
DIELECTRIC MATERIALS
ELLIPSOMETRY
EXTRAPOLATION
GAS FLOW
MAGNETRONS
OXYGEN
PARTIAL PRESSURE
RADIOWAVE RADIATION
SOLAR CELLS
SPUTTERING
SUBLIMATION
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS