Time of flight spectrometer for background-free positron annihilation induced Auger electron spectroscopy

Journal Article · Tue Mar 15 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4943858· OSTI ID:22597106

Mukherjee, S. ^[1]; Shastry, K.; Anto, C. V.; Joglekar, P. V.; Nadesalingam, M. P.; Xie, S.; Jiang, N.; Weiss, A. H. ^[2]

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1. Radiochemistry Division, Bhabha Atomic Research Center, Trombay, Mumbai (India)
2. Department of Physics, University of Texas at Arlington, Arlington, Texas 76019 (United States)

We describe a novel spectrometer designed for positron annihilation induced Auger electron spectroscopy employing a time-of-flight spectrometer. The spectrometer’s new configuration enables us to implant monoenergetic positrons with kinetic energies as low as 1.5 eV on the sample while simultaneously allowing for the detection of electrons emitted from the sample surface at kinetic energies ranging from ∼500 eV to 0 eV. The spectrometer’s unique characteristics made it possible to perform (a) first experiments demonstrating the direct transition of a positron from an unbound scattering state to a bound surface state and (b) the first experiments demonstrating that Auger electron spectra can be obtained down to 0 eV without the beam induced secondary electron background obscuring the low energy part of the spectra. Data are presented which show alternative means of estimating positron surface state binding energy and background-free Auger spectra.

• OSTI ID: 22597106
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 3; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANNIHILATION
AUGER ELECTRON SPECTROSCOPY
BEAMS
BINDING ENERGY
ELECTRONS
KINETIC ENERGY
POSITRONS
SCATTERING
SPECTRA
SURFACES
TIME-OF-FLIGHT METHOD
TIME-OF-FLIGHT SPECTROMETERS