skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Calculation of Debye-Scherrer diffraction patterns from highly stressed polycrystalline materials

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4953028· OSTI ID:22596775
 [1]; ; ;  [2];  [3]
  1. Helmholtz Zentrum Dresden-Rossendorf, 01328 Dresden (Germany)
  2. SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States)
  3. Climate and Space Sciences and Engineering, Applied Physics, and Physics, University of Michigan, Ann Arbor, Michigan 48109 (United States)

Calculations of Debye-Scherrer diffraction patterns from polycrystalline materials have typically been done in the limit of small deviatoric stresses. Although these methods are well suited for experiments conducted near hydrostatic conditions, more robust models are required to diagnose the large strain anisotropies present in dynamic compression experiments. A method to predict Debye-Scherrer diffraction patterns for arbitrary strains has been presented in the Voigt (iso-strain) limit [Higginbotham, J. Appl. Phys. 115, 174906 (2014)]. Here, we present a method to calculate Debye-Scherrer diffraction patterns from highly stressed polycrystalline samples in the Reuss (iso-stress) limit. This analysis uses elastic constants to calculate lattice strains for all initial crystallite orientations, enabling elastic anisotropy and sample texture effects to be modeled directly. The effects of probing geometry, deviatoric stresses, and sample texture are demonstrated and compared to Voigt limit predictions. An example of shock-compressed polycrystalline diamond is presented to illustrate how this model can be applied and demonstrates the importance of including material strength when interpreting diffraction in dynamic compression experiments.

OSTI ID:
22596775
Journal Information:
Journal of Applied Physics, Vol. 119, Issue 21; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English

Cited By (2)