Acid-Base Interactions at the Molecular Level: Adhesion and Friction Studies with Interfacial Force Microscopy
To examine the forces of acid-base adhesive interactions at the molecular level, we utilize the scanning probe Interracial Force Microscope (IFM). Unlike cantilever-based atomic force microscopes, the EM is a non-compliant, mechanically stable probe that provides a complete adhesive profile without jump-to-contact. In this way, we are able to quantitatively measure the work of adhesion and bond energies at well-defined, nanometer-scale single asperity contacts. In particular, we will discuss the displacement-controlled adhesive forces between self-assembled monolayer of functionalized alkanethiols strongly bound to a gold substrate and a similarly functionalized tip. We also discuss a method utilizing decoupled lateral and normal force sensors to simultaneously observe the onset of both friction and chemical bond formation. Measurements show that friction can be directly attributed to bond formation and rupture well before repulsive contact.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 2247
- Report Number(s):
- SAND98-2755J; ON: DE00002247
- Journal Information:
- Journal of Adhesion Science and Technology, Journal Name: Journal of Adhesion Science and Technology
- Country of Publication:
- United States
- Language:
- English
Similar Records
The Study of Contact, Adhesion and Friction at the Atomic Scale by Atomic Force Microscopy
Molecular level friction as revealed with a novel scanning probe