Structural and transport properties of double perovskite Dy{sub 2}NiMnO{sub 6}
Highlights: • Sol–gel citrate method is used to prepare the double perovskite Dy{sub 2}NiMnO{sub 6}. • Structure and dielectric relaxation of the sample are studied for nano and bulk phases. • The relaxation mechanism of the sample is modeled by Cole–Cole equation. • With increasing sintering temperature conductivity increases. • Electronic structures and magnetic properties have been studied by DFT calculations. - Abstract: The double perovskite oxide Dy{sub 2}NiMnO{sub 6} (DNMO) is synthesized in nano and bulk phase by the sol–gel citrate method. The Rietveld refinement of X-ray diffraction pattern of the sample at room temperature shows the monoclinic P2{sub 1}/n phase. Dielectric relaxation of the sample is investigated in the impedance and electric modulus formalisms in the frequency range from 50 Hz to 1 MHz and in the temperature range from 253 to 415 K. The Cole–Cole model is used to explain the relaxation mechanism in DNMO. The frequency-dependent maxima in the imaginary part of impedance are found to obey an Arrhenius law with activation energy of 0.346 and 0.344 eV for nano and bulk DNMO, respectively. A significant increase in conductivity of bulk DNMO has been observed than that of the nanoceramic. Electronic structures and magnetic properties of DNMO have been studied by performing first principles calculation based on density functional theory.
- OSTI ID:
- 22420810
- Journal Information:
- Materials Research Bulletin, Vol. 62; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
CERAMICS
CITRATES
DENSITY FUNCTIONAL METHOD
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DYSPROSIUM COMPOUNDS
ELECTRONIC STRUCTURE
EV RANGE
FREQUENCY DEPENDENCE
IMPEDANCE
MAGNETIC PROPERTIES
MANGANATES
MHZ RANGE
MONOCLINIC LATTICES
NICKEL COMPOUNDS
RELAXATION LOSSES
SINTERING
TEMPERATURE RANGE 0273-0400 K
X-RAY DIFFRACTION