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Title: Optical method of atomic ordering estimation

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4848491· OSTI ID:22261904
 [1];  [2]; ;  [3]
  1. Instituto de Ciencias, BUAP, Privada 17 Norte, No 3417, col. San Miguel Huyeotlipan, Puebla, Pue. (Mexico)
  2. IMEM/CNR, Parco Area delle Scienze 37/A - 43010, Parma (Italy)
  3. Ioffe Physico-Technical Institute, 26 Polytekhnicheskaya, St Petersburg 194021, Russian Federation (Russian Federation)

It is well known that within metal-organic vapor-phase epitaxy (MOVPE) grown semiconductor III-V ternary alloys atomically ordered regions are spontaneously formed during the epitaxial growth. This ordering leads to bandgap reduction and to valence bands splitting, and therefore to anisotropy of the photoluminescence (PL) emission polarization. The same phenomenon occurs within quaternary semiconductor alloys. While the ordering in ternary alloys is widely studied, for quaternaries there have been only a few detailed experimental studies of it, probably because of the absence of appropriate methods of its detection. Here we propose an optical method to reveal atomic ordering within quaternary alloys by measuring the PL emission polarization.

OSTI ID:
22261904
Journal Information:
AIP Conference Proceedings, Vol. 1566, Issue 1; Conference: ICPS 2012: 31. international conference on the physics of semiconductors, Zurich (Switzerland), 29 Jul - 3 Aug 2012; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English