Determination of dispersive optical constants of nanocrystalline CdSe (nc-CdSe) thin films

Journal Article · Fri Jun 15 00:00:00 EDT 2012 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2012.03.008· OSTI ID:22215104

Sharma, Kriti; Al-Kabbi, Alaa S.; Saini, G. S.S. ^[1]

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1. Centre of Advanced Study in Physics, Department of Physics, Panjab University, Chandigarh 160014 (India)

Highlights: ► nc-CdSe thin films are prepared by thermal vacuum evaporation technique. ► TEM analysis shows NCs are spherical in shape. ► XRD reveals the hexagonal (wurtzite) crystal structure of nc-CdSe thin films. ► The direct optical bandgap of nc-CdSe is 2.25 eV in contrast to bulk (1.7 eV). ► Dispersion of refractive index is discussed in terms of Wemple–DiDomenico single oscillator model. -- Abstract: The nanocrystalline thin films of CdSe are prepared by thermal evaporation technique at room temperature. These thin films are characterized by transmission electron microscopy (TEM), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), X-ray diffraction (XRD) and photoluminescence spectroscopy (PL). The transmission spectra are recorded in the transmission range 400–3300 nm for nc-CdSe thin films. Transmittance measurements are used to calculate the refractive index (n) and absorption coefficient (α) using Swanepoel's method. The optical band gap (E{sub g}{sup opt}) has been determined from the absorption coefficient values using Tauc's procedure. The optical constants such as extinction coefficient (k), real (ε{sub 1}) and imaginary (ε{sub 2}) dielectric constants, dielectric loss (tan δ), optical conductivity (σ{sub opt}), Urbach energy (E{sub u}) and steepness parameter (σ) are also calculated for nc-CdSe thin films. The normal dispersion of refractive index is described using Wemple–DiDomenico single-oscillator model. Refractive index dispersion is further analysed to calculate lattice dielectric constant (ε{sub L}).

• OSTI ID: 22215104
• Journal Information: Materials Research Bulletin, Vol. 47, Issue 6; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
CADMIUM SELENIDES
CRYSTAL STRUCTURE
CRYSTALS
DIELECTRIC MATERIALS
DISPERSIONS
NANOSTRUCTURES
OSCILLATORS
PERMITTIVITY
PHOTOLUMINESCENCE
REFRACTIVE INDEX
SCANNING ELECTRON MICROSCOPY
SPECTROSCOPY
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY
VACUUM EVAPORATION
X RADIATION
X-RAY DIFFRACTION