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Title: Structural and dielectric properties of A(Fe{sub 1/2}Ta{sub 1/2})O{sub 3} [A = Ba, Sr, Ca]

Journal Article · · Materials Research Bulletin
 [1]
  1. Department of Physics, Bose Institute, 93/1, Acharya Prafulla Chandra Road, Kolkata 700009, West Bengal (India)

Graphical abstract: FTIR spectra of BFT, SFT and CFT at room temperature. Research highlights: {yields} The structural and dielectric properties of BaFe{sub 1/2}Ta{sub 1/2}O{sub 3}, SrFe{sub 1/2}Ta{sub 1/2}O{sub 3} and CaFe{sub 1/2}Ta{sub 1/2}O{sub 3}. {yields} Fourier transform infrared spectra show two primary phonon modes of the samples at around 450 cm{sup -1} and 620 cm{sup -1}. {yields} The compounds show significant frequency dispersion in its dielectric properties. {yields} The relaxation mechanism of the samples is modelled by Cole-Cole equation. -- Abstract: The complex perovskite oxide barium iron tantalate (BFT), BaFe{sub 1/2}Ta{sub 1/2}O{sub 3}, strontium iron tantalate (SFT), SrFe{sub 1/2}Ta{sub 1/2}O{sub 3} and calcium iron tantalate (CFT), CaFe{sub 1/2}Ta{sub 1/2}O{sub 3} are synthesized by a solid-state reaction technique. Rietveld refinement of the X-ray diffraction data of the samples shows that BFT and SFT crystallize in cubic structure, with lattice parameter a = 4.06 A for BFT and 3.959 A for SFT, whereas CFT crystallizes in orthorhombic structure having lattice parameters a = 5.443 A, b = 5.542 A and c = 7.757 A. Fourier transform infrared spectra show two primary phonon modes of the samples at around 450 cm{sup -1} and 620 cm{sup -1}. The compounds show significant frequency dispersion in its dielectric properties. The complex impedance plane plots of the samples show that the relaxation (conduction) mechanism in these materials is purely a bulk effect arising from the semiconductive grains. The relaxation mechanism of the samples is modelled by Cole-Cole equation. The frequency dependent conductivity spectra are found to follow the power law.

OSTI ID:
22210033
Journal Information:
Materials Research Bulletin, Vol. 46, Issue 4; Other Information: Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English