Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706 (United States)
The short pulse x-ray imaging and microscopy beamline is one of the two x-ray beamlines that will take full advantage of the short pulse x-ray source in the Advanced Photon Source (APS) upgrade. A horizontally diffracting double crystal monochromator which includes a sagittally focusing second crystal will collect most of the photons generated when the chirped electron beam traverses the undulator. A Kirkpatrick-Baez mirror system after the monochromator will deliver to the sample a beam which has an approximately linear correlation between time and vertical beam angle. The correlation at the sample position has a slope of 0.052 ps/{mu}rad extending over an angular range of 800 {mu}rad for a cavity deflection voltage of 2 MV. The expected time resolution of the whole system is 2.6 ps. The total flux expected at the sample position at 10 keV with a 0.9 eV energy resolution is 5.7 Multiplication-Sign 10{sup 12} photons/s at a spot having horizontal and vertical full width at half maximum of 33 {mu}m horizontal by 14 {mu}m vertical. This new beamline will enable novel time-dispersed diffraction experiments on small samples using the full repetition rate of the APS.
- OSTI ID:
- 22118548
- Journal Information:
- Review of Scientific Instruments, Vol. 84, Issue 5; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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