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Title: BISPECTRUM OF THE SUNYAEV-ZEL'DOVICH EFFECT

Journal Article · · Astrophysical Journal
 [1]; ;  [2];  [3];  [4]
  1. High Energy Physics Division, Argonne National Laboratory, Argonne, IL 60439 (United States)
  2. Department of Physics, Yale University, New Haven, CT 06520 (United States)
  3. Department of Astronomy and Astrophysics, University of Chicago, Chicago, IL 60637 (United States)
  4. Department of Physics, McGill University, Montreal, QC H3A 2T8 (Canada)

We perform a detailed study of the bispectrum of the Sunyaev-Zel'dovich (SZ) effect. Using an analytical model for the pressure profiles of the intracluster medium, we demonstrate the SZ bispectrum to be a sensitive probe of the amplitude of the matter power spectrum parameter {sigma}{sub 8}. We find that the bispectrum amplitude scales as B {sub tSZ}{proportional_to}{sigma}{sup 11-12} {sub 8}, compared to that of the power spectrum, which scales as A {sub tSZ}{proportional_to}{sigma}{sup 7-9} {sub 8}. We show that the SZ bispectrum is principally sourced by massive clusters at redshifts around z {approx} 0.4, which have been well studied observationally. This is in contrast to the SZ power spectrum, which receives a significant contribution from less well understood low-mass and high-redshift groups and clusters. Therefore, the amplitude of the bispectrum at l {approx} 3000 is less sensitive to astrophysical uncertainties than the SZ power spectrum. We show that current high-resolution cosmic microwave background (CMB) experiments should be able to detect the SZ bispectrum amplitude with high significance, in part due to the low contamination from extragalactic foregrounds. A combination of the SZ bispectrum and the power spectrum can sharpen the measurements of thermal and kinetic SZ components and help distinguish cosmological and astrophysical information from high-resolution CMB maps.

OSTI ID:
22086386
Journal Information:
Astrophysical Journal, Vol. 760, Issue 1; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 0004-637X
Country of Publication:
United States
Language:
English