Photoluminescence properties of SrAl{sub 2}O{sub 4}:Eu{sup 2+},Dy{sup 3+} thin phosphor films grown by pulsed laser deposition

Journal Article · Thu Jul 15 00:00:00 EDT 2010 · Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films

DOI:https://doi.org/10.1116/1.3299255· OSTI ID:22053745

Ntwaeaborwa, O M; Nsimama, P D; Pitale, Shreyas; Nagpure, I M; Kumar, Vinay; Coetsee, E; Terblans, J J; Swart, H C; Sechogela, P T ^[1]

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1. Department of Physics, University of the Free State, Bloemfontein ZA 9300 (South Africa)

Thin films of SrAl{sub 2}O{sub 4}:Eu{sup 2+},Dy{sup 3+} phosphor were deposited on silicon [Si (100)] substrates using a 248 nm KrF pulsed laser. Deposition parameters, such as substrate temperature, pulse repetition rate, number of laser pulses, and base pressure, were varied during the film deposition process. Based on the x-ray diffraction data, all the films were amorphous but were emitting visible light when excited by a monochromatic xenon lamp. The chemical composition and the stoichiometry of the films determined by the Rutherford backscattering spectroscopy were consistent with the commercial SrAl{sub 2}O{sub 4}:Eu{sup 2+},Dy{sup 3+} powder used to prepare the films. Photoluminescence (PL) emission spectra of the films were characterized by major green emission with a maximum at {approx}520 nm and minor red emission with a maximum at 630 nm. The green and red photoluminescence at 520 and 630 nm are associated with the 4f{sup 6}5d{yields}4f{sup 7}({sup 8}S{sub 7/2}) and {sup 5}D{sub 0}-{sup 7}F{sub 2} transitions of Eu{sup 2+} and residual Eu{sup 3+} ions, respectively. Brighter films were shown to have relatively higher values of the root mean square surface roughness, which were determined from the atomic force microscopy data. The effects of processing parameters on the PL intensity are discussed.

• OSTI ID: 22053745
• Journal Information: Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films, Vol. 28, Issue 4; Other Information: (c) 2010 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1553-1813
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINATES
ATOMIC FORCE MICROSCOPY
DYSPROSIUM IONS
EMISSION SPECTRA
ENERGY BEAM DEPOSITION
EUROPIUM IONS
LASER RADIATION
LIGHT BULBS
MONOCHROMATIC RADIATION
PHOTOLUMINESCENCE
PULSED IRRADIATION
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SILICON
STRONTIUM COMPOUNDS
THIN FILMS
VISIBLE RADIATION
XENON
X-RAY DIFFRACTION