Preparation and characterization of RF sputtered Ce-V mixed oxide thin films

Journal Article · Tue Jun 05 00:00:00 EDT 2012 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4710162· OSTI ID:22004127

Malini, D Rachel; Sanjeeviraja, C ^[1]

---

1. Department of Physics, N. M. S. Sermathai Vasan College, Madurai-625 012 (India)

Cerium-Vanadium mixed oxide thin films were deposited at room temperature by varying RF power in RF magnetron sputtering. The morphology and structural features were studied by taking FESEM and XRD and optical properties were analyzed by taking transmittance and absorption spectra. The crystalline film shows orthorhombic CeVO{sub 3} phase and the observed grain size varies from 89.4nm to 208.7nm. The transmission increases and the absorption edge at 330nm is blue shifted with increase in RF power. The optical band gap is found to increase from 1.59 to 1.94eV. The PL spectra shows blue shift in the emission peak centered at a wavelength of 495nm with increase in RF power.

• OSTI ID: 22004127
• Journal Information: AIP Conference Proceedings, Vol. 1447, Issue 1; Conference: 56. DAE solid state physics symposium 2011, Kattankulathur, Tamilnadu (India), 19-23 Dec 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTRA
CERIUM COMPOUNDS
EMISSION SPECTROSCOPY
ENERGY GAP
FIELD EMISSION
GRAIN SIZE
INFRARED SPECTRA
MORPHOLOGY
OPTICAL PROPERTIES
ORTHORHOMBIC LATTICES
PHOTOLUMINESCENCE
SCANNING ELECTRON MICROSCOPY
SPECTRAL SHIFT
THIN FILMS
ULTRAVIOLET SPECTRA
VANADATES
VISIBLE SPECTRA
X-RAY DIFFRACTION