Optical Sideband Generation: a Longitudinal Electron Beam Diagnostic Beyond the Laser Bandwidth Resolution Limit

Journal Article · Thu Nov 04 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3520387· OSTI ID:21428835

Tilborg, J van; Matlis, N H; Plateau, G R; Leemans, W P ^[1]

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1. Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

Electro-optic sampling (EOS) is widely used as a technique to measure THz-domain electric field pulses such as the self-fields of femtosecond electron beams. We present an EOS-based approach for single-shot spectral measurement that excels in simplicity (compatible with fiber integration) and bandwidth coverage (overcomes the laser bandwidth limitation), allowing few-fs electron beams or single-cycle THz pulses to be characterized with conventional picosecond probes. It is shown that the EOS-induced optical sidebands on the narrow-bandwidth optical probe are spectrally-shifted replicas of the THz pulse. An experimental demonstration on a 0-3 THz source is presented.

• OSTI ID: 21428835
• Journal Information: AIP Conference Proceedings, Vol. 1299, Issue 1; Conference: 14. advanced accelerator concepts workshop, Annapolis, MD (United States), 13-19 Jun 2010; Other Information: DOI: 10.1063/1.3520387; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ACCELERATORS
BEAM MONITORING
BEAM PRODUCTION
ELECTRIC FIELDS
ELECTRON BEAMS
FIBERS
LASERS
PROBES
PULSES
RESOLUTION
SPECTRAL SHIFT
THZ RANGE
BEAMS
FREQUENCY RANGE
LEPTON BEAMS
MONITORING
PARTICLE BEAMS