A Silicon d-spacing Mapping Measurement System With Resolution of 10{sup -9}

Journal Article · Wed Jun 23 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3463361· OSTI ID:21410361

Xiaowei, Zhang; Sugiyama, Hiroshi ^[1]; Fugimoto, Hiroyuki; Waseda, Atsushi ^[2]; Takatomi, Toshikazu ^[3]

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1. Photon Factory, High Energy Accelerator Research Organization (KEK), TSUKUBA-SHI, IBARAKI (Japan)
2. National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST), TSUKUBA-SHI, IBARAKI (Japan)
3. Mechanical Engineering Center, High Energy Accelerator Research Organization (KEK), TSUKUBA-SHI, IBARAKI (Japan)

For determination of the Avogadro's number, a self-referenced lattice comparator established at the Photon Factory to deal with a d-spacing mapping measurement over the cross section of a 4 {approx} 5 inches FZ silicon rod. For uncertainty of 1x10{sup -8} of the unit cell volume, it is necessary to measure lattice parameter of silicon with resolution of 3x10{sup -9} at least. In this paper, we report the principle of our lattice comparator, characterize our measurement system, and show some mapping measurement results of FZ silicon with resolution of 3x10{sup -9}.

• OSTI ID: 21410361
• Journal Information: AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463361; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CROSS SECTIONS
INTERFEROMETERS
LATTICE PARAMETERS
MAPPING
MONOCHROMATORS
OPTICS
PHOTON BEAMS
PHOTONS
RESOLUTION
RODS
SILICON
X RADIATION
BEAMS
BOSONS
ELECTROMAGNETIC RADIATION
ELEMENTARY PARTICLES
ELEMENTS
IONIZING RADIATIONS
MASSLESS PARTICLES
MEASURING INSTRUMENTS
RADIATIONS
SEMIMETALS