Nanopositioning techniques development for synchrotron radiation instrumentation applications at the Advanced Photon Source
- Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
At modern synchrotron radiation sources and beamlines, high-precision positioning techniques present a significant opportunity to support state-of-the-art synchrotron radiation research. Meanwhile, the required instrument positioning performance and capabilities, such as resolution, dynamic range, repeatability, speed, and multiple axes synchronization are exceeding the limit of commercial availability. This paper presents the current nanopositioning techniques developed for the Argonne Center for Nanoscale Materials (CNM)/Advanced Photon Source (APS) hard x-ray nanoprobe and high-resolution x-ray monochromators and analyzers for the APS X-ray Operations and Research (XOR) beamlines. Future nanopositioning techniques to be developed for the APS renewal project will also be discussed.
- OSTI ID:
- 21410230
- Journal Information:
- AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463186; (c) 2010 American Institute of Physics; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ACCURACY
ADVANCED PHOTON SOURCE
AVAILABILITY
HARD X RADIATION
INTERACTIONS
MONOCHROMATORS
NANOSTRUCTURES
PERFORMANCE
PHOTONS
POSITIONING
RESOLUTION
SYNCHRONIZATION
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
VELOCITY
X-RAY DIFFRACTION
BOSONS
BREMSSTRAHLUNG
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTARY PARTICLES
IONIZING RADIATIONS
MASSLESS PARTICLES
RADIATION SOURCES
RADIATIONS
SCATTERING
STORAGE RINGS
X RADIATION