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Title: Nanopositioning techniques development for synchrotron radiation instrumentation applications at the Advanced Photon Source

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3463186· OSTI ID:21410230
 [1]
  1. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)

At modern synchrotron radiation sources and beamlines, high-precision positioning techniques present a significant opportunity to support state-of-the-art synchrotron radiation research. Meanwhile, the required instrument positioning performance and capabilities, such as resolution, dynamic range, repeatability, speed, and multiple axes synchronization are exceeding the limit of commercial availability. This paper presents the current nanopositioning techniques developed for the Argonne Center for Nanoscale Materials (CNM)/Advanced Photon Source (APS) hard x-ray nanoprobe and high-resolution x-ray monochromators and analyzers for the APS X-ray Operations and Research (XOR) beamlines. Future nanopositioning techniques to be developed for the APS renewal project will also be discussed.

OSTI ID:
21410230
Journal Information:
AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463186; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English