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Title: Plasma modification of polymer Seragel{reg_sign} membrane surface in RF discharge

Conference ·
OSTI ID:212956
 [1]; ;  [2]
  1. Moscow State Univ. (Russian Federation)
  2. Moscow Inst. of Physics and Technology (Russian Federation); and others

The chemical structure and composition of polymer films produced on the surface of Seragel{reg_sign} (SG) gas separating membranes as a result of plasma treatment were investigated by ESCA and IR spectroscopy methods. The SG composite membranes are now used in industry for separating of hostile gases. The gas selective properties of polymer membranes can be substantially enlarged after plasma modification in RF discharges. The SG membrane has a nonfabric basis 50 mkm thick, teflon filter 150 mkm thick with pore diameter about 1 mkm - intermediate layer and gas separating layer 3-5 mkm thick. This membrane initial selectivity for O{sub 2}/N{sub 2} is about 3.5, the gas permeation rate for O{sub 2} is 10 liter/(m{sup 2}{center_dot}hour{center_dot}arm). Separating layer is a result of copolymerization process of sulphone, buthadiene and methylisocianate. The plasma polymerization processes were performed in Capacitively Coupled Radio Frequency discharge in argon with acetone additives in the range of 0.1%-7%. The typical parameters of the discharge are: frequency of RF voltage 13.56 MHz, discharge power about 100 Wt, gas flow rate 63 cm{sup 3}(stp)/min, pressure 0.5 Torr. The treatment time was 15 min in all experiments. The permeation rates for gases O{sub 2}, He, CO{sub 2} were measured before and after processing by means of specially designed installation based on pressure increased method in the range 0.1{hor_ellipsis}3000 filter/(m{sup 2}{center_dot}hour{center_dot}arm). The investigations were carried out by means of electron spectrometer LHS-10 and IR spectrometer UR-20 with manifold reflection installation. The obtained ESCA and IR data were used for the correlation analysis between chemical structure and composition and gas permeation properties. The spectrum analysis was made by means of data.

OSTI ID:
212956
Report Number(s):
CONF-950749-; TRN: 96:010106
Resource Relation:
Conference: 22. international conference on phenomena in ionized gases, Hoboken, NJ (United States), 31 Jul - 4 Aug 1995; Other Information: PBD: 1995; Related Information: Is Part Of XXII International conference on phenomena in ionized gases. Contributed papers 4; Becker, K.H.; Carr, W.E.; Kunhardt, E.E. [eds.]; PB: 256 p.
Country of Publication:
United States
Language:
English