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Title: Subtractive renormalization of the chiral potentials up to next-to-next-to-leading order in higher NN partial waves

Journal Article · · Physical Review. C, Nuclear Physics
; ;  [1]
  1. Institute of Nuclear and Particle Physics, and Department of Physics and Astronomy, Ohio University, Athens, Ohio 45701 (United States)

We develop a subtractive renormalization scheme to evaluate the P-wave NN scattering phase shifts using chiral effective theory potentials. This allows us to consider arbitrarily high cutoffs in the Lippmann-Schwinger equation (LSE). We employ NN potentials computed up to next-to-next-to-leading order (NNLO) in chiral effective theory, using both dimensional regularization and spectral-function regularization. Our results obtained from the subtracted P-wave LSE show that renormalization of the NNLO potential can be achieved by using the generalized NN scattering lengths as input - an alternative to fitting the constant that multiplies the P-wave contact interaction in the chiral effective theory NN force. However, to obtain a reasonable fit to the NN data at NNLO the generalized scattering lengths must be varied away from the values extracted from the so-called high-precision potentials. We investigate how the generalized scattering lengths extracted from NN data using various chiral potentials vary with the cutoff in the LSE. The cutoff dependence of these observables, as well as of the phase shifts at T{sub lab}{approx_equal}100 MeV, suggests that for a chiral potential computed with dimensional regularization the highest LSE cutoff it is sensible to adopt is approximately 1 GeV. Using spectral-function regularization to compute the two-pion-exchange potentials postpones the onset of cutoff dependence in these quantities but does not remove it.

OSTI ID:
21293808
Journal Information:
Physical Review. C, Nuclear Physics, Vol. 80, Issue 3; Other Information: DOI: 10.1103/PhysRevC.80.034002; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0556-2813
Country of Publication:
United States
Language:
English