Preliminary Studies of Ions Emission in a Small Plasma Focus Device of Hundreds of Joules
- Comision Chilena de Energia Nuclear, Casilla 188-D, Santiago (Chile)
- Center for Research on Plasma Physics and Pulsed Power (Chile)
- Universidad de Chile, Santiago (Chile)
Ion beam emission in plasma focus (PF) discharges was originally investigated to explain the strong forward anisotropy observed in the neutron. Several properties of PF emitted deuteron beams have been measured, including their angular distributions and energy spectra in devices operating with energies from 1 kJ to 1 MJ. At present there is a growing interest in the development of very small PF devices operating under 1 kJ. As part of the characterization program of the very low energy PF devices (<1 kJ) developed at the Chilean Nuclear Energy Commission, the charges particle emission in hydrogen (H{sub 2}) and mixture (H{sub 2}+%Ar) are being studied. In order to obtain an estimation of the ions energy spectrum and ionization grade, by using time of flight method, a graphite collector system operating in the bias ion collector mode was constructed and it is being used. Preliminary results of the ion beams measurements in different experimental conditions, at a plasma focus device of 400 joules (PF-400 J) are presented.
- OSTI ID:
- 21255342
- Journal Information:
- AIP Conference Proceedings, Vol. 1088, Issue 1; Conference: 7. international conference on dense Z-pinches, Alexandria, VA (United States), 12-21 Aug 2008; Other Information: DOI: 10.1063/1.3079732; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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