skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: CCD imaging from 20 eV to 8 keV

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.47934· OSTI ID:21153881
;  [1]
  1. Department of Pure and Applied Physics, The Queens University of Belfast, BT7 1NN, Northern Ireland (United Kingdom)

Pulsed x-ray diagnostics operating in the kilovolt and sub-kilovolt regimes are required in the study of x-ray laser schemes. Sensitivity and dynamic range measurements are presented for position-sensitive detector systems, designed and optimized for these spectral regions. Both systems employ cooled, multi-pinned phase CCD's for image capture. For photon energies from 20 eV to 1 keV (where direct detection with front illuminated devices is inadequate), a phosphor transducer is used, coupled to the CCD via a fiber optic faceplate with 6 {mu}m diameter channels. From 800 eV to 8 keV, direct detection of electron-hole pairs generated in the depletion region of the CCD is employed. The systems have been tested with single-shot sensitivity using a 10 Hz, 2J/7{center_dot}5 ns injection seeded Nd:YAG laser operated at 2{omega}, using Bragg crystal and flat field grazing incidence spectrometers to monitor the resonance emission from aluminium and carbon targets irradiated at {approx}10{sup 12} W cm{sup -2}. At 182 A, the sensitivity and dynamic range are enhanced with respect to that for a standard photographic detector, by factors of 8 and 300 respectively. An absolute calibration of the 700 eV-8 keV detector system performed at 1.6 keV, has been shown to agree with a calculation of sensitivity based on photo-absorption data. For this system, the enhancement in sensitivity and dynamic range over direct exposure x-ray film is 175 and 43 respectively.

OSTI ID:
21153881
Journal Information:
AIP Conference Proceedings, Vol. 332, Issue 1; Conference: 4. international colloquium: X-ray lasers 1994, Williamsburg, VA (United States), 15-20 May 1994; Other Information: DOI: 10.1063/1.47934; (c) 1994 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English