skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Digital processing of SEM images for the assessment of evaluation indexes of cleaning interventions on Pentelic marble surfaces

Journal Article · · Materials Characterization
; ;  [1]
  1. National Technical University of Athens, School of Chemical Engineering, Lab of Materials Science and Engineering, Iroon Polytechniou 9, 15780 Zografou, Athens (Greece)

In this work, digital processing of scanning-electron-microscopy images utilized to assess cleaning interventions applied on the Pentelic marble surfaces of the National Archaeological Museum and National Library in Athens, Greece. Beside mineralogical and chemical characterization that took place by scanning-electron-microscopy with Energy Dispersive X-ray Spectroscopy, the image-analysis program EDGE was applied for estimating three evaluation indexes of the marble micro-structure. The EDGE program was developed by the U.S. Geological Survey for the evaluation of cleaning interventions applied on Philadelphia City Hall. This computer program analyzes scanning-electron-microscopy images of stone specimens cut in cross-section for measuring the fractal dimension of the exposed surfaces, the stone near-surface fracture density, the shape factor (a surface roughness factor) and the friability index which represents the physico-chemical and physico-mechanical stability of the stone surface. The results indicated that the evaluation of the marble surface micro-structure before and after cleaning is achieved by the suggested indexes, while the performance of cleaning interventions on the marble surfaces can be assessed.

OSTI ID:
21062169
Journal Information:
Materials Characterization, Vol. 58, Issue 11-12; Conference: 10. Euroseminar on microscopy applied to building materials (EMABM), Paisley, Scotland (United Kingdom), 21-24 Jun 2005; Other Information: DOI: 10.1016/j.matchar.2007.04.021; PII: S1044-5803(07)00161-1; Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
Country of Publication:
United States
Language:
English