The PolLux Microspectroscopy Beam line at the Swiss Light Source

Journal Article · Fri Jan 19 00:00:00 EST 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2436109· OSTI ID:21052564

Flechsig, U; Quitmann, C; Raabe, J; Boege, M ^[1]; Fink, R ^[2]; Ade, H ^[3]

---

1. Paul Scherrer Institut, Swiss Light Source, 5232 Villigen PSI (Switzerland)
2. Physikalische Chemie II, Universitaet, Erlangen-Nuernberg, 91058 Erlangen (Germany)
3. Department of Physics, North Carolina State University, Raleigh, NC 27695 (United States)

The optical design and performance expectations of a Fresnel zone plate based scanning transmission x-ray microscopy (STXM) beamline at a bending magnet of the Swiss Light Source is described. The instrument allows microspectroscopy in polymer science in the water window and the study of magnetic materials with circularly polarized light. The beamline is based on a spherical grating monochromator with two gratings at a constant deviation angle and covers a photon energy range from 200 eV to 1000 eV.

• OSTI ID: 21052564
• Journal Information: AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436109; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAM OPTICS
DESIGN
DIFFRACTION GRATINGS
EV RANGE
MAGNETIC MATERIALS
MAGNETS
MICROSCOPY
MONOCHROMATORS
PERFORMANCE
PHOTON BEAMS
PHOTONS
PLATES
POLYMERS
SWISS LIGHT SOURCE
WATER
X RADIATION