High-yield synthesis and characterization of monodisperse sub-microsized CoFe{sub 2}O{sub 4} octahedra
- Department of Chemistry, Luoyang Normal University, Luoyang 471022 (China)
- Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100080 (China)
In this study, sub-microsized CoFe{sub 2}O{sub 4} octahedra with a high yield are synthesized via a simple hydrothermal route under mild conditions. The as-prepared products are characterized by conventional techniques of XRD, SEM, TEM, ED and HR-TEM. The results show that the as-synthesized sample exhibits octahedral morphology with a narrow size distribution. The edge size of CoFe{sub 2}O{sub 4} octahedra is estimated to be about 0.10-0.14 {mu}m. The growth process is also monitored by time and temperature-dependent observation. It is found that the reaction temperature has no obvious influence on the product morphology but a significant effect on the size of CoFe{sub 2}O{sub 4} octahedra, while the reaction time determines the final morphology of the product. Moreover, it is displayed that the citrate ions play a key role in the formation of CoFe{sub 2}O{sub 4} octahedra. Furthermore, the possible growth mechanism of the sub-microsized CoFe{sub 2}O{sub 4} octahedra is discussed on the basis of a series of experiments. Magnetic measurements show that sub-micro-sized CoFe{sub 2}O{sub 4} octahedra exhibit obvious ferromagnetic behaviors. The saturation magnetization (M {sub s}), remanent magnetization (M {sub r}), and coercivity (H {sub c}) are determined to be 85.8, 29.2 emu/g and 892 Oe, respectively. - Graphical abstract: Sub-micro-sized CoFe{sub 2}O{sub 4} octahedra with a high yield are synthesized via a simple hydrothermal route under mild conditions. TEM image shows that the edge size of CoFe{sub 2}O{sub 4} octahedra is estimated to be about 0.10-0.14 {mu}m.
- OSTI ID:
- 21015671
- Journal Information:
- Journal of Solid State Chemistry, Vol. 180, Issue 2; Other Information: DOI: 10.1016/j.jssc.2006.11.003; PII: S0022-4596(06)00588-3; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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