Exciton related stimulated emission in ZnO polycrystalline thin film deposited by filtered cathodic vacuum arc technique

Journal Article · Mon May 08 00:00:00 EDT 2006 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2202728· OSTI ID:20779287

Zhang, X H; Chua, S J; Yong, A M; Li, H D; Yu, S F; Lau, S P ^[1]

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1. Institute of Materials Research and Engineering, 3 Research Link, Singapore 117602 (Singapore)

Random lasing was observed from ZnO polycrystalline thin film deposited by filtered cathodic vacuum arc technique. It is found that the random lasing action results from exciton-exciton scattering process when the excitation intensity is low. However, with increasing excitation intensity, the well-resolved discrete lasing modes evolve into broad stimulated emission band due to electron-hole plasma formation when the photogenerated exciton density exceeds the Mott density. The short spontaneous emission decay time measured at low temperature suggests that the radiative recombination rate is enhanced by the nanosized ZnO grains in the polycrystalline film through exciton-light coupling.

• OSTI ID: 20779287
• Journal Information: Applied Physics Letters, Vol. 88, Issue 19; Other Information: DOI: 10.1063/1.2202728; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
EXCITONS
GRAIN SIZE
NANOSTRUCTURES
POLYCRYSTALS
RECOMBINATION
SCATTERING
SEMICONDUCTOR LASERS
SEMICONDUCTOR MATERIALS
SOLID-STATE PLASMA
STIMULATED EMISSION
THIN FILMS
VACUUM COATING
ZINC OXIDES