Short focal length Kirkpatrick-Baez mirrors for a hard x-ray nanoprobe
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 and University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)
We describe progress in the fabrication of short-focal-length total-external-reflection Kirkpatrick-Baez x-ray mirrors with ultralow figure errors. The short focal length optics produce nanoscale beams (<100 nm) on conventional ({approx}64 m long) beamlines at third generation synchrotron sources. The total-external reflection optics are inherently achromatic and efficiently focus a white (polychromatic) or a tunable monochromatic spectrum of x rays. The ability to focus independent of wavelength allows novel new experimental capabilities. Mirrors have been fabricated both by computer assisted profiling (differential polishing) and by profile coating (coating through a mask onto ultra-smooth surfaces). A doubly focused 85x95 nm{sup 2} hard x-ray nanobeam has been obtained on the UNICAT beamline 34-ID at the Advanced Photon Source. The performance of the mirrors, techniques for characterizing the spot size, and factors limiting focusing performance are discussed.
- OSTI ID:
- 20723249
- Journal Information:
- Review of Scientific Instruments, Vol. 76, Issue 11; Other Information: DOI: 10.1063/1.2125730; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
Achromatic Nested Kirkpatrick-Baez Mirror Optics for Hard X-ray Nanofocusing
Achromatic nested Kirkpatrick-Baez mirror optics for hard x-ray nanofocusing.