The structure, magnetism, and electrical-transport properties of the Heusler alloys Co{sub 2}Cr{sub 1-x}Fe{sub x}Al (x=0.2-0.6)

Journal Article · Sun May 15 00:00:00 EDT 2005 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.1847271· OSTI ID:20709692

Ming, Zhang; Wolf, Anne L; Zhang, L; Tegus, O; Brueck, Ekkes; Guangheng, Wu; Boer, Frank R. de ^[1]

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1. Van der Waals-Zeeman instituut, Universiteit van Amsterdam, Valckenierstraat 67, 1018XE Amsterdam (Netherlands) and State Key Laboratory for Magnetism, Institute of Physics, Chinese Academy of Sciences, Beijing 100080 (China)

We synthesize the polycrystalline Heusler compounds Co{sub 2}Cr{sub 1-x}Fe{sub x}Al (x=0.2-0.6). The x-ray diffraction patterns show A2 structure rather than L2{sub 1} structure. The magnetic moment and the Curie temperature increase with increasing x. The electrical resistivity characterizes the Co{sub 2}Cr{sub 1-x}Fe{sub x}Al compounds to be not typical metals and the temperature dependence of the resistivity changes from metallic to semiconductinglike behavior with increasing Cr concentrations. We attribute the fact, which we observe for most of the compounds smaller magnetic moments than the theoretical values and the low magnetoresistance in these alloys, to the considerably high level of Co-(Cr, Fe)-type disorder.

• OSTI ID: 20709692
• Journal Information: Journal of Applied Physics, Vol. 97, Issue 10; Conference: 49. annual conference on magnetism and magnetic materials, Jacksonville, FL (United States), 7-11 Nov 2004; Other Information: DOI: 10.1063/1.1847271; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHARGED-PARTICLE TRANSPORT
CHROMIUM ALLOYS
COBALT ALLOYS
CRYSTAL STRUCTURE
CURIE POINT
FERROMAGNETIC MATERIALS
HEUSLER ALLOYS
IRON ALLOYS
MAGNETIC MOMENTS
MAGNETISM
MAGNETIZATION
MAGNETORESISTANCE
ORDER-DISORDER TRANSFORMATIONS
POLYCRYSTALS
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION