Epitaxially grown La-modified BiFeO{sub 3} magnetoferroelectric thin films

Journal Article · Mon May 30 00:00:00 EDT 2005 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1941474· OSTI ID:20702419

Lee, Dongeun; Kim, Min G; Ryu, Sangwoo; Jang, Hyun M; Lee, Sang G ^[1]

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1. Department of Materials Science and Engineering, and Pohang Accelerator Laboratory (PAL), Pohang University of Science and Technology (POSTECH), Pohang 790-784 (Korea, Republic of)

Effects of the La modification on the structure and magnetoferroelectric properties of BiFeO{sub 3} (BFO)-based films were examined. On SrTiO{sub 3} (001) planes, all the BFO-based films (for x between 0 and 0.15 in Bi{sub 1-x}La{sub x}FeO{sub 3} with the film thickness of 300 nm) were grown epitaxially along [001] direction of tetragonal symmetry. However, the La modification gradually changes the film structure from a monoclinically tilted state to a nontilted tetragonal-like state. Both extended x-ray absorption fine structure and x-ray absorption near edge structure spectra revealed the presence of a strong in-plane compressive stress. Room-temperature magnetization-field curves indicated that the saturation magnetization of these BFO-based epitaxial films increased with the degree of La modification. La-modified BFO film capacitors fabricated on SrRuO{sub 3}-buffered SrTiO{sub 3} (001) substrates showed fatigue-free ferroelectric switching characteristics up to 4x10{sup 10} read/write cycles at a frequency of 1 MHz.

• OSTI ID: 20702419
• Journal Information: Applied Physics Letters, Vol. 86, Issue 22; Other Information: DOI: 10.1063/1.1941474; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ABSORPTION SPECTROSCOPY
BISMUTH COMPOUNDS
CAPACITORS
ENERGY BEAM DEPOSITION
EPITAXY
FERROELECTRIC MATERIALS
FERROMAGNETIC MATERIALS
FINE STRUCTURE
IRON OXIDES
LANTHANUM COMPOUNDS
LASER RADIATION
MAGNETIZATION
PULSED IRRADIATION
RUTHENIUM COMPOUNDS
STRONTIUM TITANATES
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X-RAY SPECTROSCOPY