PCI Effects on Coincidence Spectra Associated with the Emission of Two Auger Electrons

Journal Article · Fri Jan 24 00:00:00 EST 2003 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1536389· OSTI ID:20636465

Sheinerman, S ^[1]; Lablanquie, P ^[2]; Penent, F; Hall, R I; Ahmad, M ^[3]; Hikosaka, Y; Ito, K ^[4]

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1. St. Petersburg State Maritime Technical University, 198262 St. Petersburg (Russian Federation)
2. LURE, Centre Universitaire Paris-Sud, 91898 Orsay (France)
3. DIAM, Universite P. and M. Curie, 75252 Paris Cedex 05 (France)
4. IMSS, Photon Factory, Oho 1-1, Tsukuba 305-0801 (Japan)

Experimental investigation of the threshold electron / fast electron coincidences allows one to select lines which are associated with two Auger electron emission. Such an investigation carried out for near threshold photoionization of Xe 4d shell reveals a considerable distortion of the lineshapes due to Post Collision Interaction (PCI). Analysis of the PCI influence on the Auger lineshapes allows us to clarify dynamics of the two Auger electron ejection. Our study shows that both double Auger decay (DA) and cascade Auger decay (CA) could contribute to the dynamics of the decay process.

• OSTI ID: 20636465
• Journal Information: AIP Conference Proceedings, Vol. 652, Issue 1; Conference: 19. International conference on X-ray and inner-shell processes, Rome (Italy), 24-28 Jun 2002; Other Information: DOI: 10.1063/1.1536389; (c) 2003 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AUGER ELECTRON SPECTROSCOPY
COLLISIONS
DECAY
ELECTRON EMISSION
ELECTRON SPECTRA
ELECTRONS
INNER-SHELL IONIZATION
INTERACTIONS
LINE BROADENING
PHOTOIONIZATION
XENON