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Title: Intrinsic, n- and p-doped a-Si:H thin films grown by dc magnetron sputtering with doped targets

Conference ·
OSTI ID:20107882

Intrinsic, n- and p-type a-Si:H films were deposited by dc magnetron sputtering and analyzed with several techniques. The films were synthesized in a reactive Ar-H{sub 2} atmosphere giving H contents in the range of 3--20 at %. The films were sputtered from pure silicon targets and doped silicon targets with 1 at % B or P. Doping by co-sputtering from composite Si/B{sub 4}C targets was also explored. The doping concentrations were 3 x 10{sup 20} {minus} 2 x 10{sup 21} cm{sup {minus}3} for the p-type films and 2.6--2.9 x 10{sup 19} cm{sup {minus}3} for the n-type films. The conductivity was in the range 10{sup {minus}2}--10{sup {minus}4} {Omega}{sup {minus}1} cm{sup {minus}1} for p-doped films and 10{sup {minus}5} {Omega}{sup {minus}1} cm{sup {minus}1} for the best n-doped films. Band gap estimations were obtained from dielectric function data and showed an increase with hydrogen content. A comparison to device quality PECVD-samples was also made.

Research Organization:
Linkoeping Univ. (SE)
OSTI ID:
20107882
Resource Relation:
Conference: 1999 Materials Research Society Spring Meeting, San Francisco, CA (US), 04/05/1999--04/09/1999; Other Information: PBD: 1999; Related Information: In: Amorphous and heterogeneous silicon thin films: Fundamentals to devices -- 1999. Materials Research Society symposium proceedings: Volume 557, by Branz, H.M.; Collins, R.W.; Okamoto, Hiroaki; Guha, S.; Schropp, R. [eds.], 908 pages.
Country of Publication:
United States
Language:
English