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Title: Sign of the piezoelectric field in asymmetric GaInN/AlGaN/GaN single and double quantum wells on SiC

Conference ·
OSTI ID:20104602

The authors study both GaInN/GaN/AlGaN quantum wells with an asymmetric barrier structure grown on SiC substrate and GaN/AlGaN asymmetric double quantum well (ADQW) structures. In the first case, a time-resolved study reveals an enhanced oscillator strength when the AlGaN barrier is on top of the GaInN quantum well. In comparison to their previous study of the same structure grown on sapphire, the authors find that the sign of the field is the same in both cases: the field points towards the substrate. In the case of ADQW, they observed not only intrawell transitions of both a 4 nm and a 2 nm QW separated by a 2.5 nm AlGaN barrier but also an interwell transition between the two QWs in the photoluminescence. The lifetimes and emission energies of the transitions can be well explained by the existence of the piezoelectric field built in the QWs.

Research Organization:
Technische Univ. Braunschweig (DE)
OSTI ID:
20104602
Resource Relation:
Conference: 1999 Materials Research Society Fall Meeting, Boston, MA (US), 11/28/1999--12/03/1999; Other Information: PBD: 2000; Related Information: In: GaN and related alloys -- 1999. Materials Research Society symposium proceedings, Volume 595, by Myers, T.H.; Feenstra, R.M.; Shur, M.S.; Amano, Hiroshi [eds.], [1050] pages.
Country of Publication:
United States
Language:
English