A Radiation Hardened by Design FPGA with Distributed Single Event Upset Sensors, Embedded Error Handler, and 8Mb Embedded MRAM Configuration Storage in 22nm Bulk FinFET CMOS.
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0003525
- OSTI ID:
- 2004097
- Report Number(s):
- SAND2022-9723C; 708340
- Resource Relation:
- Conference: Proposed for presentation at the NSREC in ,
- Country of Publication:
- United States
- Language:
- English
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