Production of sow multiple-charged ions in rare gases ions and atoms collisions at low energy (1-4 keV).
- Tbilisi State Univ., Georgia (Russian Federation)
The energy dependence of the absolute values of summed ({sigma}) and partial ({sigma}{sub n}) cross-sections of target gas ions production in rare gases ions and atoms collisions was defined by potential method, supplemented by magnetic mass-analysis. Here {sigma} and {sigma}{sub n} are connected by relation: {sigma}{sub n}={sigma}/(2(1+1/{alpha}{sub n})), where {alpha}{sub n}=I{sub n}/{Sigma}{sub n}I{sub n} is part of n-charged state ions. The authors results show, that practically there are no ions produced with n>2. For symmetrical pairs (like He{sup +}-He, Ne{sup +}-Ne) {alpha}{sub 2{minus}}<0.1%, for He{sup +}-Ne, Ar{sup +}-Kr, Kr{sup +}-Xe value of {alpha}{sub 2} is {approximately}1% ({sigma}{sub 2}{approximately}<10{sup {minus}18}cm{sup 2}), for He{sup +}-Kr, He{sup +}-Xe this value increases with colliding energy and at E=4 keV reaches {approximately} 3%. However, for He{sub +}, Ne{sup +}-Ar, Kr, Xe {alpha}{sub 2} is significant ({alpha}{sub 2}{approximately}20-25%, {sigma}{sub 2}{approximately} 2 {center_dot} 10{sup {minus}17}cm{sup 2} for He{sup +}-Ar at E=4 keV). Analysis of the correlation diagram for colliding particle systems (MS) shows, that double ionization process in these cases is realizing by electron capture process at same time excitation of autoionization states of target gas ions: A{sup +}+B{sup 0}{yields}A{sup 0}+B{sup +*}{yields}A{sup 0}+B{sup 2+}+e.
- OSTI ID:
- 199826
- Report Number(s):
- CONF-941129-; TRN: 95:005652-0328
- Resource Relation:
- Conference: 13. international conference on the application of accelerators in research and industry, Denton, TX (United States), 7-10 Nov 1994; Other Information: PBD: 1994; Related Information: Is Part Of Thirteenth international conference on the application of accelerators in research and industry; Duggan, J.L.; Morgan, I.L. [eds.]; PB: 201 p.
- Country of Publication:
- United States
- Language:
- English
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