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Title: Effect of Co2N impurity on the superconducting properties of δ-MoN thin films grown by polymer assisted deposition

Journal Article · · Materials Chemistry and Physics
ORCiD logo [1];  [2];  [3];  [4]; ORCiD logo [5];  [6]
  1. National Atomic Energy Commission (CNEA), Rio Negro (Argentina)
  2. Tsinghua University, Beijing (China)
  3. IBM at Albany NanoTech, NY (United States)
  4. Konkuk University, Seoul (Korea, Republic of)
  5. Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
  6. Konkuk University, Seoul (Korea, Republic of); State University of New York at Buffalo, NY (United States)

We report the effect of Co2N impurity on the superconducting properties of δ-MoN thin films grown by polymer-assisted deposition on c-cut sapphire (Al2O3). The films show a superconducting transition temperature of 10.4 K and an upper critical field Hc2(0) perpendicular to the film surface around 3 T. The latter corresponds to a relatively large coherence length ξ, which enhances the two-dimensional limit when the magnetic field is applied parallel to the film surface. In comparison with pure δ-MoN films, the inclusion of Co2N impurity in the δ-MoN films could significantly modify the critical current density at the vortex-free state. In conclusion, the ability to tune the superconducting properties of metal-nitride superconductors by introducing chemically and structurally compatible impurity may find potential applications for superconducting single-photon detectors.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE
Grant/Contract Number:
89233218CNA000001
OSTI ID:
1997165
Alternate ID(s):
OSTI ID: 1777501
Report Number(s):
LA-UR-21-20376
Journal Information:
Materials Chemistry and Physics, Vol. 259; ISSN 0254-0584
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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