Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging

Zhang, Yueheng; Porter, J. Nicholas; Wilkin, Matthew J.; Harder, Ross; Cha, Wonsuk; Suter, Robert M.; Liu, He; Schnebly, Landon; Sandberg, Richard L.; Miller, Joshua A.; Tischler, Jon; Pateras, Anastasios; Rollett, Anthony D.

doi:10.1107/s160057752300365x

Title: Mapping nanocrystal orientations via scanning Laue diffraction microscopy for multi-peak Bragg coherent diffraction imaging

Journal Article · Tue May 30 00:00:00 EDT 2023 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/s160057752300365x· OSTI ID:1989698

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^[2]; Wilkin, Matthew J. ^[1]; Harder, Ross ^[3];

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^[1]; Liu, He ^[1];

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^[2]; Tischler, Jon ^[3];

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Carnegie Mellon University, Pittsburgh, PA (United States)
Brigham Young University, Provo, UT (United States)
Argonne National Laboratory (ANL), Argonne, IL (United States)

The recent commissioning of a movable monochromator at the 34-ID-C endstation of the Advanced Photon Source has vastly simplified the collection of Bragg coherent diffraction imaging (BCDI) data from multiple Bragg peaks of sub-micrometre scale samples. Laue patterns arising from the scattering of a polychromatic beam by arbitrarily oriented nanocrystals permit their crystal orientations to be computed, which are then used for locating and collecting several non-co-linear Bragg reflections. The volumetric six-component strain tensor is then constructed by combining the projected displacement fields that are imaged using each of the measured reflections via iterative phase retrieval algorithms. Complications arise when the sample is heterogeneous in composition and/or when multiple grains of a given lattice structure are simultaneously illuminated by the polychromatic beam. Here, a workflow is established for orienting and mapping nanocrystals on a substrate of a different material using scanning Laue diffraction microscopy. The capabilities of the developed algorithms and procedures with both synthetic and experimental data are demonstrated. The robustness is verified by comparing experimental texture maps obtained with Laue diffraction microscopy at the beamline with maps obtained from electron back-scattering diffraction measurements on the same patch of gold nanocrystals. Such tools provide reliable indexing for both isolated and densely distributed nanocrystals, which are challenging to image in three dimensions with other techniques.

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Research Organization:: Brigham Young Univ., Provo, UT (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: SC0022133; SC0019096

OSTI ID:: 1989698

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 30, Issue 4; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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