Electrical edge effect induced photocurrent overestimation in low-light organic photovoltaics

Zhou, Xiaobo; Zhao, Chao; Alotaibi, Awwad Nasser; Wu, Hongbo; Naveed, Hafiz Bilal; Lin, Baojun; Zhou, Ke; Ma, Zaifei; Collins, Brian A.; Ma, Wei

doi:10.1016/j.joule.2022.06.008

Title: Electrical edge effect induced photocurrent overestimation in low-light organic photovoltaics

Journal Article · Wed Jul 06 00:00:00 EDT 2022 · Joule

DOI:https://doi.org/10.1016/j.joule.2022.06.008· OSTI ID:1981688

Zhou, Xiaobo ^[1]; Zhao, Chao ^[1]; Alotaibi, Awwad Nasser ^[2]; Wu, Hongbo ^[3]; Naveed, Hafiz Bilal ^[1]; Lin, Baojun ^[1]; Zhou, Ke ^[1]; Ma, Zaifei ^[3]; Collins, Brian A. ^[2]; Ma, Wei ^[1]

Xi'an Jiaotong Univ., Shaanxi (China)
Washington State Univ., Pullman, WA (United States)
Donghua University, Shanghai (China)

In many literatures, the short-circuit current (J_SC) of indoor organic photovoltaics is overestimated, leading to severely wrong device performance evaluation and analysis. In this work, based on the equivalent circuit model, we demonstrate that electrical edge effect is sensitive to both transverse surface resistance and light intensity. At low light intensity, the electrical edge effect could lead to J_SC being significantly overestimated, i.e., by 100% and even more. We show that for a PM6:Y6 device capped with a MoOX layer, when measured under 0.01 sun, the usually overlooked interface doping mechanism would lead to J_SC and PCE overestimation by 51% and 15%, respectively. Besides, we show that the magnitude of J_SC overestimation drastically increases with high photoactive-layer surface roughness. This work emphasized the significant electrical edge effect on J_SC evaluations for low-light solar cells and is conducive to understanding the intrinsic mechanism of edge effect, promoting a healthier development of organic photovoltaics.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Natural Science Foundation of China (NSFC); China Postdoctoral Science Foundation; National Science Foundation (NSF)

Grant/Contract Number:: AC02-05CH11231; 21704082; 21875182; 22109125; 2017M623162; DMR-1905790

OSTI ID:: 1981688

Journal Information:: Joule, Vol. 6, Issue 8; ISSN 2542-4351

Publisher:: Elsevier - Cell PressCopyright Statement

Country of Publication:: United States

Language:: English

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14 SOLAR ENERGY
Chemistry
Energy & fuels
Materials science
Photocurrent overestimation
Edge effect
Interface doping
Resistivity
Low light intensity
Organic photovoltaics

Title: Electrical edge effect induced photocurrent overestimation in low-light organic photovoltaics

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