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Title: Surmounting the interband threshold limit by the hot electron excitation of multi-metallic plasmonic AgAuCu NPs for UV photodetector application

Journal Article · · CrystEngComm
DOI:https://doi.org/10.1039/d2ce00367h· OSTI ID:1875807

We report multi-metallic alloy NPs composed of various elemental compositions can surmount the interband threshold limit of mono-metallic NPs and thus can offer a promising route to boost up the performance limit of conventional ultraviolet photodetectors (PDs). In this work, a hybrid UV-PD configuration has been demonstrated by combining the multi-metallic plasmonic alloy NPs of AgCu, AuCu, and AgAuCu on a GaN photoactive layer in order to exploit the improved photo carrier injection by the strong hot electrons and LSPR. Among various devices, the tri-metallic AgAuCu NP PD demonstrates the highest performance with a remarkably high photocurrent of 1.47 x 10-2 A at 1 V with fast rise (Tr) and fall (Tf) times of 170 and 700 ms with a very stable current. This leads to the superior figure-of-merit parameters of the PD with a photoresponsivity of 4.3 x 106 mA W-1, detectivity of 3.52 x 1012 Jones and EQE of 1.39 x 106%, which is ~16 times higher than the bare GaN PD. This ranks the AgAuCu PD as one of the best GaN based UV photodetectors. The photocurrent enhancement and excellent figure-of-merit can be attributed to the significantly increased photo carrier injection by the efficient hot electron generation via the LSPR and improved interfacial barrier characteristics by the tri-metallic elemental synergy.

Research Organization:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program; National Research Foundation of Korea (NRF); Kwangwoon University
Grant/Contract Number:
89233218CNA000001; NRF-2019R1A2C4069438; NRF-2018R1A6A1A03025242
OSTI ID:
1875807
Alternate ID(s):
OSTI ID: 1869739
Report Number(s):
LA-UR-22-25125
Journal Information:
CrystEngComm, Vol. 24, Issue 22; ISSN 1466-8033
Publisher:
Royal Society of ChemistryCopyright Statement
Country of Publication:
United States
Language:
English

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