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Title: Impact of illumination and encapsulant resistivity on polarization-type potential-induced degradation on n-PERT cells

Journal Article · · Progress in Photovoltaics
DOI:https://doi.org/10.1002/pip.3505· OSTI ID:1839230
 [1]; ORCiD logo [2]
  1. P&SP Elastomers R&D, Dow Inc., Lake Jackson, TX (United States)
  2. National Renewable Energy Lab. (NREL), Golden, CO (United States)

Abstract Power loss caused by polarization‐type potential‐induced degradation (PID‐p) in a variety of high‐performance photovoltaic cell types has been observed to be recoverable via subsequent illumination and in some cases preventable via simultaneous illumination. In this report, we describe the results of a study in which the front faces of n‐PERT cells encapsulated in polymers with a broad range of electrical resistivity were exposed to varying and controlled irradiance during PID testing. For a low resistivity ethylene‐vinyl acetate copolymer encapsulant, no reduction in the rate or extent of power loss was observed for irradiance as high as 1,000 W/m 2 , whereas for high and intermediate resistivity polyolefin encapsulants, 100 and 300 W/m 2 , respectively, prevented power loss. We introduce a simple model based on charge accumulation that facilitates interpretation of these results whereby degradation via charge accumulation under voltage stress and recovery due to light exposure are opposing and interdependent phenomena that describe the susceptibility of a module to power loss.

Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC36-08GO28308; AC36‐08GO28308
OSTI ID:
1839230
Alternate ID(s):
OSTI ID: 1860532
Report Number(s):
NREL/JA-5K00-80058; MainId:42261; UUID:ce4dc107-1ade-4a32-a511-468041aa1dd8; MainAdminID:63456
Journal Information:
Progress in Photovoltaics, Vol. 30, Issue 5; ISSN 1062-7995
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English

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