Thermal transport across nanoscale damage profile in sapphire irradiated by swift heavy ions

Abdullaev, A.; Chauhan, V. S.; Muminov, B.; O’Connell, J.; Skuratov, V. A.; Khafizov, M.; Utegulov, Z. N.

doi:10.1063/1.5126413

Title: Thermal transport across nanoscale damage profile in sapphire irradiated by swift heavy ions

Journal Article · Tue Jan 21 00:00:00 EST 2020 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.5126413· OSTI ID:1767717

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Nazarbayev Univ., Nur-Sultan (Kazakhstan)
The Ohio State Univ., Columbus, OH (United States)
Univ. of California, Riverside, CA (United States)
Nelson Mandela Univ., Port Elizabeth (South Africa). Center for HRTEM
Joint Inst. for Nuclear Research, Dubna (Russia). Flerov Lab. of Nuclear Reactions; National Research Nuclear Univ. (MEPhI), Moscow (Russia); Dubna State Univ., Dubna (Russia)

In this work, we studied the degradation of thermal conductivity in single crystal sapphire (α-Al₂O₃) irradiated by 167 MeV Xe swift heavy ions (SHIs) over the multiple fluences in the range of 10¹²–10¹⁴ ions/cm². Thermal conductivity was measured primarily in the cross-plane direction using a noncontact ultrafast optical pump-probe technique called picosecond time domain thermoreflectance (TDTR). Multiple samples with variable ion fluences allowed us to probe distinct regions resulting from different regimes of microstructure evolution caused by electronic energy loss. By tuning the penetration depth of the thermal waves using different modulation frequencies, two regions with distinct conductivities were identified and the values of which were found to be consistent with phonon-mediated thermal transport models while the microstructure was confirmed by electron microscopy characterization. These damaged regions were determined to be a several micrometer thick ion track region and several tens of nanometer-thick amorphous layer present only above 5.0 × 10¹³ ions/cm². These results demonstrate the applicability of TDTR to resolve thermal transport behavior in SHI irradiated oxides having nonhomogeneous damage profile on a nanometer scale. The presented approach facilitates future studies aiming at resolving the impact of distinct damage resulting from electronic and nuclear stopping regimes under irradiation.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Thermal Energy Transport under Irradiation (TETI)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Kazakhstan Ministry of Education and Science; Kazakhstan Ministry of Industry and Infrastructural Development; Nazarbayev University

Grant/Contract Number:: AC07-05ID14517; AP05130446; AP06851392; 110119FD4501

OSTI ID:: 1767717

Alternate ID(s):: OSTI ID: 1592803

Journal Information:: Journal of Applied Physics, Vol. 127, Issue 3; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 15 works

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Title: Thermal transport across nanoscale damage profile in sapphire irradiated by swift heavy ions

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