Observations of x-ray emission from a plasma focus device
- Tsinghua Univ., Beijing (China)
- Northwest Inst. of Nuclear Technology, Xian (China)
This paper describes a pulsed x-ray source that has been developed and investigated. Hydrogen is injected into DPF-250 device and the pressure is (4 {approximately} 6) Torr in the discharge chamber. The x-ray photo energy spectrum was measured by LiF Thermoluminescence Dose Elements (TLDS) matched different filters of several materials. Six filters were selected and their thickness are: Beryllium-100, 500, aluminum-27.4, copper-10.49, 20.33 and 200 {micro}m. Therefore, the x-ray energy spectra they have measured are about (3 {approximately} 60)KeV and total 70% of the total spectral emission at h{upsilon} < 25 KeV. The x-ray yield is deduced from digital recorder of bolometer through a beryllium foil transmission filter (50 {micro}m thick). At the same time, the analogue signal output from bolometer was recorded on oscillograph. The authors have obtained the yield as (50 {approximately} 90) J/shot into 4 {pi}, corresponding photo energy to be higher than 2.5 KeV, when the stored energy was 40 KJ. The time dependent x-ray intensity from DPF was recorded with silicon PIN detector and a Tektronix 7844 oscilloscope. Two peaks of x-ray output was observed. The duration time of x-ray is about 200 ns. Pinhole image was acquired of the DPF discharge. At 90 degree direction, with respect to electrode axis, is placed a x-ray pinhole camera, pinhole diameter 0.3 mm. The pictures show two strong exposed contours of target of anode and focus.
- OSTI ID:
- 163138
- Report Number(s):
- CONF-950612-; ISBN 0-7803-2669-5; TRN: IM9604%%242
- Resource Relation:
- Conference: 22. international conference on plasma science, Madison, WI (United States), 5-8 Jun 1995; Other Information: PBD: 1995; Related Information: Is Part Of IEEE conference record -- abstracts: 1995 IEEE international conference on plasma science; PB: 312 p.
- Country of Publication:
- United States
- Language:
- English
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