Basis for the Bauschinger effect in copper single crystals: changes in the long-range internal stress with reverse deformation
- National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Univ. of Southern California, Los Angeles, CA (United States)
In this study, the long-range internal stresses (LRIS) associated with the Bauschinger effect were investigated using synchrotron X-ray microbeam diffraction and reversed deformation experiments. [100]-oriented Cu single crystals were deformed in compression to approximately -0.3 true strain, followed by tension to a strain of approximately +0.02. Two conclusions are arrived at from this work: First, the LRIS are confirmed in this work to be small relative to the applied stress both before and after reversal. Second, the LRIS persist after 2% reversed strain despite a significant drop in the overall dislocation density by dynamic recovery. This appears to satisfy the necessary condition for LRIS to significantly contribute to a Bauschinger effect in materials. Lastly, the pronounced Bauschinger effect in Cu is probably best rationalized by a combination of both the LRIS and the Orowan–Sleeswyk model that relies on a non-uniform distribution of dislocation obstacles without a substantial LRIS.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); National Science Foundation (NSF)
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1560049
- Journal Information:
- Journal of Materials Science, Vol. 54, Issue 8; ISSN 0022-2461
- Publisher:
- SpringerCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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