Evidence for capillary waves on dewetted polymer film surfaces : a combined x-ray and atomic force microscopy study.
Journal Article
·
· Physical Review Letters
No abstract prepared.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS); Inst. fur Experimentelle und Angewandte Physik der Univ. Kiel; State Univ. of New York at Stony Brook (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 15002993
- Journal Information:
- Physical Review Letters, Vol. 81, Issue 13; Other Information: PBD: 28 Sep 1998; Related Information: Sep. 28, 1998
- Country of Publication:
- United States
- Language:
- English
Similar Records
Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study
Novel x-ray diffraction microscopy technique for measuring textured grains of thin-films. measurement by combined use of x-ray topography with x-ray diffractometry.
Dynamics of polymer/metal nanocomposite films at short times as studied by x-ray standing waves.
Journal Article
·
Tue Sep 01 00:00:00 EDT 1998
· Physical Review Letters
·
OSTI ID:15002993
+6 more
Novel x-ray diffraction microscopy technique for measuring textured grains of thin-films. measurement by combined use of x-ray topography with x-ray diffractometry.
Journal Article
·
· Nuclear Instruments and Methods in Physics Research, Section A
·
OSTI ID:15002993
+4 more
Dynamics of polymer/metal nanocomposite films at short times as studied by x-ray standing waves.
Journal Article
·
Thu Jul 01 00:00:00 EDT 2004
· Macromolecules
·
OSTI ID:15002993
+2 more