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Title: Tunable Narrow-Band High Harmonic Beamline Optimized for Ultrafast Soft X-Ray Photoemission and Imaging

Technical Report ·
OSTI ID:1491381
 [1]
  1. Kapteyn Murnane Laboratories, Inc., Boulder, CO (United States); Univ. of Colorado, Boulder, CO (United States)

We achieved all technical objectives as promised in the proposal, and the program stayed within its budget. In this Phase II program, we developed a coherent EUV beamline based on a novel modular configuration that includes KMLabs’ eXtreme Ultraviolet Ultrafast Source (XUUS) product. The basic beamline has achieved a spectral resolution (relative bandwidth) of 1/50 at 62 eV and 1/100 at 25 eV. Our technique offers maximum flexibility and minimum costs to achieve the goals, when tuning the photon energies from 25 eV to 100 eV and at the same time maintaining high efficiencies in this wavelength range. For this work, we used a single-stage ti:sapphire ultrafast laser/amplifier system to perform High Harmonic Generation (HHG) in hollow core fibers, generating EUV and soft X-rays. It was necessary to develop a laser beam pointing stabilization system to deliver the laser beam into the hollow fiber. Additionally, we constructed a single toroidal mirror and single grating monochromator to focus, select and steer the EUV beam at high efficiency and low cost. We have sold some of the beamline components to selected customers. This EUV beamline offers a cost effective and efficient way to deliver a bright, monochromatic, short pulse, stable EUV “laser” beam to our customers’ experiments. We validated this beamline in magnetic dynamics studies at the University of Colorado. For research, this beamline is ideal for spintronics and low dimensional material studies. In industry, the beamline can be optimized for semiconductor metrology and 3D nano-imaging.

Research Organization:
Kapteyn Murnane Laboratories, Inc., Boulder, CO (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
SC0006514
OSTI ID:
1491381
Type / Phase:
SBIR (Phase IIB)
Report Number(s):
Final Report - DOE - KML - SC0006514 - Phase IIa
Country of Publication:
United States
Language:
English

Related Subjects

EUV