An improved method for determining carrier densities via drive level capacitance profiling

Warren, Charles W.; Roe, Ellis T.; Miller, D. Westley; Shafarman, William N.; Lonergan, Mark C.

doi:10.1063/1.4983367

Title: An improved method for determining carrier densities via drive level capacitance profiling

Journal Article · Mon May 15 00:00:00 EDT 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4983367· OSTI ID:1466216

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Univ. of Oregon, Eugene, OR (United States). Dept. of Physics
Univ. of Delaware, Newark, DE (United States). Inst. of Energy Conversion
Univ. of Oregon, Eugene, OR (United States). Dept. of Chemistry and Biochemistry

In this paper, we demonstrate that an analytic relationship between coefficients in the Taylor expansion of the junction capacitance can be exploited to yield more precise determinations of carrier densities in drive level capacitance profiling (DLCP). Improvements are demonstrated on data generated according to the DLCP theory and in measurements performed on a CuIn_xGa_1–xSe₂ device. We argue that the improved DLCP method is especially important for non-uniform devices, which are more susceptible to noise in the capacitance data used in DLCP because they require that the amplitude of the drive level be restricted. Importantly, the analysis does not require the collection of any data other than what is typically collected during a DLCP measurement while employing fewer independent parameters than the model that is typically used in DLCP. Finally and thus, we expect that it will be readily adoptable by those who perform DLCP measurements.

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Research Organization:: Univ. of Oregon, Eugene, OR (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office

Grant/Contract Number:: EE0004946

OSTI ID:: 1466216

Alternate ID(s):: OSTI ID: 1361892

Journal Information:: Applied Physics Letters, Vol. 110, Issue 20; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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References (19)

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Title: An improved method for determining carrier densities via drive level capacitance profiling

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