Local nanoscale strain mapping of a metallic glass during in situ testing

Gammer, Christoph; Ophus, Colin; Pekin, Thomas C.; Eckert, Jurgen; Minor, Andrew M.

doi:10.1063/1.5025686

Title: Local nanoscale strain mapping of a metallic glass during in situ testing

Journal Article · Mon Apr 23 00:00:00 EDT 2018 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5025686· OSTI ID:1462978

^[1];

^[2]; Pekin, Thomas C. ^[3]; Eckert, Jurgen ^[4]; Minor, Andrew M. ^[3]

Austrian Academy of Sciences, Leoben (Austria)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Univ. of California, Berkeley, CA (United States)
Austrian Academy of Sciences, Leoben (Austria); Montanuniversitat Leoben, Leoben (Austria)

The local elastic strains during tensile deformation in a CuZrAlAg metallic glass are obtained by fitting an elliptic shape function to the characteristic amorphous ring in electron diffraction patterns. Scanning nanobeam electron diffraction enables strain mapping with a resolution of a few nanometers. Here, a fast direct electron detector is used to acquire the diffraction patterns at a sufficient speed to map the local transient strain during continuous tensile loading in situ in the transmission electron microscope. The elastic strain in tensile direction was found to increase during loading. After catastrophic fracture, a residual elastic strain that relaxes over time was observed.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1462978

Alternate ID(s):: OSTI ID: 1434829

Journal Information:: Applied Physics Letters, Vol. 112, Issue 17; Related Information: © 2018 Author(s).; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 23 works

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